We have in our store a versatile collection of supreme quality Functional Tester. These testers are supplied as per the variegated requirements of our valued patrons. Tester offered by us is a multi-purpose testing device that is used paramatic control of digital and analog electronic units. Tester offered by us works on the basic principle of controlling impact generation. Tester offered by us is made as per the prevailing norms and regulations of this industry and is widely used for fault location. Functional Tester offered by us is known for the following quality attributes:
- Separate system display
- Sturdy construction
- Dimensional accuracy
- Optimum performance
Sovtest ATE Sovtest ATE is known in the Russian Electronics market as a designer, manufacturer, and reliable supplier of the state-of-the art test equipment. Functional Tester FT17: FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling of the results. FT-17 can also be used for fault location on the component level with the help of analogue-signature analysis. FT-17 is designed on the basis of GX7xxx instrumental racks (Geotest Inc, USA) with 3 to 20 slots for standard PXI and PXI Express test blocks. PXI is the most widespread and the most prospective for today industrial standard, maintained by the great number of apparatus manufacturers. Supporting different PXI block from any manufacturer allows to fit GX7xxx with a wide range of apparatus, e.g. analog meters and generators, input-output digital blocks, multiplexers, programmable and fixed power supply units, interface blocks, image-processing systems, etc. Fault Locators SFL: SFL1500, SFL2500, SFL3000 of SFL Fault Locators designed by Sovtest ATE Ltd were launched to the market. The devices were successfully tested for the compliance to GOST R at the enterprise and also at the independent laboratory. Sovtest ATE Ltd produces the Locators as commercial equipment and the devices are available at the finished-products storage area. Ã¢â¬Â¢ The devices operate on the basis of analogue signature analysis (ASA); sometimes this method is called VI (voltage Ã¢â¬â current). Ã¢â¬Â¢ The essence of a method consists that the device transmits to the screen of the unit or PC the current-voltage characteristic (signature) of the circuit under analysis, and the signature is compared with reference. The reference signature can be obtained from the workable (golden) module (the device has two channels) or from the album of reference signatures provided with the device. Ã¢â¬Â¢ Moreover, the device has its own memory for 128 signatures. Each signature is stored in the memory under certain number. Ã¢â¬Â¢ Design variation with signatures stored in Flash or PC memory is also possible. Ã¢â¬Â¢ For testing SMD-components on the device printed-circuit boards there is a RLC function - component type recognition and rating definition function. Ã¢â¬Â¢ Test is performed without working voltage supply on the board, the device sends safe level and frequency signals required for signature construction. Ã¢â¬Â¢ The signature analysis allows defining of all types of elements: analog, digital, electromechanical, etc. Ã¢â¬Â¢ Signature comparison is automatic. Ã¢â¬Â¢ Difference limit (tolerance) is set by operator. Ã¢â¬Â¢ Integrated functional generator allows workability appreciating of such important components as transistors, thyristors, optocouplers, etc. without unsoldering them out of the circuit and without damaging its printed circuit tracks. Generator has a step control of frequency (2 levels) and polarity, and also it provides smooth adjustment of level and pulse duration. Operational Modes: a) Real-time mode (direct comparison): The device compares two equal units Ã¢â¬â reference unit and unit being tested Ã¢â¬â and the result of the test is displayed on the PC monitor screen. b) Rapid test mode: The device tests multi-terminal components (in general, connectors and IC) using multiplexer with 128 channels. In each channel it sequentially scans the state of all outputs of the tested unit comparatively to GND, evaluating the coincidence / non-coincidence of the signatures in the given tolerance field. c) Programming mode: The device checks the tested unit according to the set testing program. Operator sets probe following the program orders, and the device makes a comparison automatically. Reference signature file allows not using second (reference) unit during the test.